The forensic characterization of polyethylene films by elemental analysis using total-refelction x-ray fluorescence (TXRF) spectrometry
Main Author: | |
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Format: | Print Book |
Language: | English |
Published: |
1999
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In: | Year: 1999 |
Check availability: | HBZ Gateway |
Subito Delivery Service: | Order now. |
Keywords: |
Physical Description: | XIV, 272 S. |
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