Peters, E. M., Mertz, C., & Burraston, B. (2004). An emotion-based model of risk perception and stigma susceptibility: Cognitive appraisals of emotion, affective reactivity, worldviews, and risk perceptions in the generation of technological stigma. Risk analysis, 24(5), 1349-1367. doi:10.1111/j.0272-4332.2004.00531.x
Chicago-Zitierstil (17. Ausg.)Peters, Ellen M., C.K Mertz, und Burt Burraston. "An Emotion-based Model of Risk Perception and Stigma Susceptibility: Cognitive Appraisals of Emotion, Affective Reactivity, Worldviews, and Risk Perceptions in the Generation of Technological Stigma." Risk Analysis 24, no. 5 (2004): 1349-1367. https://doi.org/10.1111/j.0272-4332.2004.00531.x.
MLA-Zitierstil (9. Ausg.)Peters, Ellen M., et al. "An Emotion-based Model of Risk Perception and Stigma Susceptibility: Cognitive Appraisals of Emotion, Affective Reactivity, Worldviews, and Risk Perceptions in the Generation of Technological Stigma." Risk Analysis, vol. 24, no. 5, 2004, pp. 1349-1367, https://doi.org/10.1111/j.0272-4332.2004.00531.x.