Stouthamer-Loeber, M., Maguin, E., Van Kammen, W., Zhang, Q., Farrington, D., & Loeber, R. (1993). The double edge of protective and risk factors for delinquency: Interrelations and developmental patterns. Development and psychopathology, 5(4), 683-701. doi:10.1017/S0954579400006234
Chicago-Zitierstil (17. Ausg.)Stouthamer-Loeber, Magda, Eugene Maguin, Welmoen Van Kammen, Quanwu Zhang, David Farrington, und Rolf Loeber. "The Double Edge of Protective and Risk Factors for Delinquency: Interrelations and Developmental Patterns." Development and Psychopathology 5, no. 4 (1993): 683-701. https://doi.org/10.1017/S0954579400006234.
MLA-Zitierstil (9. Ausg.)Stouthamer-Loeber, Magda, et al. "The Double Edge of Protective and Risk Factors for Delinquency: Interrelations and Developmental Patterns." Development and Psychopathology, vol. 5, no. 4, 1993, pp. 683-701, https://doi.org/10.1017/S0954579400006234.