The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns

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Bibliographic Details
Contributors: VanKammen, Welmoet Bok (Other) ; Loeber, Rolf (Other) ; Farrington, David (Other) ; Maguin, Eugene (Other) ; VanKammen, Welmoet Bok 1948- ; Loeber, Rolf 1942-2017 ; Farrington, David 1944-
Format: Electronic/Print Article
Language:English
Published: 1993
In: Development and psychopathology
Online Access: Volltext (doi)
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ISSN:0954-5794
DOI:10.1017/S0954579400006234