Cita APA (7a ed.)

VanKammen, W. B., Loeber, R., Farrington, D., & Maguin, E. (1993). The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns. Development and psychopathology, 5(4), 683-701.

Cita Chicago Style (17a ed.)

VanKammen, Welmoet Bok, Rolf Loeber, David Farrington, y Eugene Maguin. "The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns." Development and Psychopathology 5, no. 4 (1993): 683-701.

Cita MLA (9a ed.)

VanKammen, Welmoet Bok, et al. "The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns." Development and Psychopathology, vol. 5, no. 4, 1993, pp. 683-701.