VanKammen, W. B., Loeber, R., Farrington, D., Maguin, E., VanKammen, W. B., Loeber, R., & Farrington, D. (1993). The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns. Development and psychopathology, 5(4), 683-701. doi:10.1017/S0954579400006234
Chicago Style (17th ed.) CitationVanKammen, Welmoet Bok, Rolf Loeber, David Farrington, Eugene Maguin, Welmoet Bok VanKammen, Rolf Loeber, and David Farrington. "The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns." Development and Psychopathology 5, no. 4 (1993): 683-701. https://doi.org/10.1017/S0954579400006234.
MLA (8th ed.) CitationVanKammen, Welmoet Bok, et al. "The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns." Development and Psychopathology, vol. 5, no. 4, 1993, pp. 683-701, https://doi.org/10.1017/S0954579400006234.