APA (7th ed.) Citation

VanKammen, W. B., Loeber, R., Farrington, D., Maguin, E., VanKammen, W. B., Loeber, R., & Farrington, D. (1993). The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns. Development and psychopathology, 5(4), 683-701. doi:10.1017/S0954579400006234

Chicago Style (17th ed.) Citation

VanKammen, Welmoet Bok, Rolf Loeber, David Farrington, Eugene Maguin, Welmoet Bok VanKammen, Rolf Loeber, and David Farrington. "The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns." Development and Psychopathology 5, no. 4 (1993): 683-701. https://doi.org/10.1017/S0954579400006234.

MLA (8th ed.) Citation

VanKammen, Welmoet Bok, et al. "The Double Edge of Protective and Risk Factors for Delinquency - Interrelations and Developmental Patterns." Development and Psychopathology, vol. 5, no. 4, 1993, pp. 683-701, https://doi.org/10.1017/S0954579400006234.

Warning: These citations may not always be 100% accurate.